| Mineral Surface Characterization by Atomic Force Microscopy (AFM) | |
| LECTURERS: | Prof. S. Churakov |
| SCOPE: | |
| HELD AT: | BE |
| CATEGORY: | Analytical Methods and Modelling |
| ECTS Credits: | 1.5 |
| PREREQUISITES: | Crystallography I + II in BSc course |
| REQUISITES: | |
| FORMAT: | 1 Lecture day and 2 lab practice days (maximum 3 students) |
| FREQUENCY: | biennially in spring semester, held in odd years |
| CONTENTS: | Theoretical and practical introduction to the Atomic Force Microscopy. Acquisition of surface topography in contact and noncontact mode. In situ observation of mineral dissolution kinetics at atomic scale. Basic theory of AFM (contact and dynamic mode). Sample preparation, instrument functionality, imaging and interpretation of result obtained in different scanning modes |
| ASSESSMENT: | oral exam |
(prer): Courses with prerequisites.